M |
Million |
MACT |
Maximum Achievable Control Technology |
MALDI |
Matrix-assisted Laser Desorption And Ionization |
MAN |
Metropolitan Area Network |
MAP |
Manufacturing Automation Protocol |
MATS |
Moisture Assisted Test Structures |
MAWP |
Maximum Allowable Working Pressure |
MB |
Machine Batch |
MBC |
Machine Bath Collection |
MBE |
Molecular Beam Epitaxy |
MBL |
Model-based Library |
MBMS |
Molecular Beam Mass Spectrometry |
MBPC |
Model-based Process Control |
MBTC |
Model-based Temperature Control |
MBX |
Message Bus Exchange |
MCA |
Measurement Capability Analysis |
MCBA |
Mean Cycles Between Assists |
MCBF |
Mean Cycles Between Failures |
MCBI |
Mean Cycles Between Interrupts |
MCBSE |
Mean Cycles Between Scrap Events |
MCM |
Multichip Module |
MCM |
Manufacturing Cycle Management |
MCP |
Master Control Processor |
MCP |
Multichip Package |
MCP |
Microchannel Plate |
MCR |
Mechanical Cold Run |
MCS |
Material Control System |
MCT |
Mercury Cadmium Telluride |
MCU |
Microprocessor Control Unit |
MCU |
Mobile Calibration Unit |
MCVD |
Metal Chemical Vapor Deposition |
Md |
Mendelevium |
MD |
Molecular Dynamics |
MD-MOS |
Multi-drain Metal-oxide Semiconductor |
MDC |
Mechanical Dry Cycle |
MDL |
Minimum Detection Limit |
MDQ |
Market-driven Quality |
MDS |
Modify Device Status |
MDS |
Modeling Data Specification |
MDU |
Modular Dispensing Unit |
MEBS |
Medium Energy Backscattering Spectrometry |
MED |
Modeling For Equipment Design |
MEEF |
Mask Error Enhancement Factor |
MEIS |
Medium Energy Ion Scattering |
mELT |
Modified Etch Lift-off |
MEM |
Manufacturing Enterprise Model |
MEM |
Manufacturing Equipment Monitor |
MEMS |
Microelectromechanical System |
MEMS |
Micromachines |
MERIE |
Magnetically Enhanced Reactive Ion Etching |
MES |
Manufacturing Execution System |
MESC |
Modular Equipment Standards Committee (SEMI) |
MESC |
Modular Equipment Sub-Committee For Communications |
MESFET |
Metal-semiconductor Field Effect Transistor |
MET |
Micro-exposure Tool |
METL |
Multi-element Two-layer |
METS |
Materials And Equipment Trading Service |
MeV |
Mega-electrovolt |
MFC |
Mass Flow Controller |
MFM |
Mass Flow Meter |
MFS |
Modified Fused Silica |
Mg |
Magnesium |
MG |
Manufactured Goods |
MGC |
Manufactured Goods Collection |
MGE |
Modulator Generalized Ellipsometry |
MHI |
Material Hazard Index |
MHT |
Mechanical Handling Test |
MHz |
Megahertz |
MIC |
Monolithic Integrated Circuit |
MID |
Material ID |
MIE |
Magnetron Ion Etching |
MIE |
Mask Inspection Enclosure |
MIGS |
Metal-induced Gap State |
MIM |
Metal-insulator-metal |
MIMAC |
Measurement And Improvement Of Manufacturing Capacity |
MIMD |
Management Information Of Metrology Data |
MIMO |
Multi-input, Multi-output |
MIS |
Metal Insulator Silicon |
MIS |
Metal Insulator Semiconductor |
MLCC |
Multilayer Ceramic Capacitors |
MLL |
Modify Lot Location |
MLM |
Multilevel Metal |
MLP |
Multilayer Perceptron |
MLR |
Message Log Report |
MLV |
Modify Logging Versions |
MM |
Manufacturing Methods |
MM |
Machine Model |
MMC |
Manufacturing Methods Council |
MMD |
Microlithographic Mask Development Program |
MMIC |
Monolithic Microwave Integrated Circuit |
MMM |
Material Movement Management |
MMMC |
Machine Material Movement Component |
MMMS |
Material Movement Management Standard |
MMO |
Multimodel Optimization |
MMOS |
Modified MOS |
MMST |
Microelectronics Manufacturing Science And Technology |
Mn |
Manganese |
MNA |
Match Network Analyzer |
MNOS |
Metal-nitride-oxide Semiconductor |
MNPD |
Maximum Non-printable Defect |
MNS |
Metal-nitride Semiconductor |
Mo |
Molybdenum |
MO |
Metal-organic |
MOCVD |
Metal-organic Chemical Vapor Deposition |
MOP |
Modify Operating Procedures |
MOS |
Metal-oxide Semiconductor |
MOS-C |
Metal-oxide Semiconductor Capacitor |
MOSFET |
Metal-oxide Semiconductor Field Effect Transistor |
mp |
Melting Point |
MP |
Massively Parallel |
MP-OES |
Multipoint Optical Emission Spectroscopy |
Mpa |
Mega Pascals |
MPP |
Multiphase Printing |
MPRES |
Modular Plasma Reactor Simulator |
MPU |
Microprocessor Unit |
MPX |
Multiplex |
MRF |
Magnorheological Finishing |
MRP |
Materials Requirements Planning |
MRP-II |
Manufacturing Resource Planning |
MRS |
Materials Research Society |
MRS |
Mass Resolving Slit |
MS |
Mass Spectrometry |
MS |
Mass Spectrometer |
MS |
Mass Spectroscopy |
MSB |
Most Significant Bit |
MSD |
Mass Selective Detector |
MSDS |
Material Safety Data Sheet |
MSEM |
Metrology Specific Equipment Model |
MSFR |
Mid-spatial Frequency Roughness |
MSG |
Management Steering Group |
MSHA |
Mine Safety And Health Administration |
MSI |
Medium-scale Integration |
MSI |
Manufacturing Support Item |
MSID |
Mass Spectrometer Lead Detector |
MSL |
Modify System Logging |
MSLD |
Mass Spectrometer Leak Detector |
MSS |
Modify System State |
MSTAB |
Manufacturing Systems Technical Advisory Board |
MTAS |
Methyltriacetoxysilene |
MTBA |
Mean Time Between Assists |
MTBAp |
Mean (productive) Time Between Assists |
MTBC |
Mean Time Between Cleans |
MTBF |
Mean Time Between Failures |
MTBFp |
Mean (productive) Time Between Failures |
MTBI |
Mean Time Between Interrupts |
MTBI |
Mean Time Between Incidents |
MTBIp |
Mean (productive) Time Between Interrupts |
MTF |
Modulation Transfer Function |
MTOL |
Mean Time Off Line |
MTOL |
Mean Time On Line |
MTS |
Material Tracking Standard |
MTTA |
Mean Time To Assist |
MTTC |
Mean Time To Correct |
MTTCR |
Mean Time To Correct And Recover |
MTTF |
Mean Time To Failure |
MTTR |
Mean Time To Repair |
MUL |
Modify User Login |
MUP |
Modify User Password |
MV |
Megavolt |
MVC |
Model View Controller |
MVH |
Micro Via Hole |
MVTR |
Moisture Vapor Transmission Rate |
MW |
Molecular Weight |
MWBC |
Mean Wafers Between Cleans |
MWBF |
Mean Wafers Between Failures |
MWBI |
Mean Wafers Between Interrupts |
MWT |
Monitor Wafer Turner |