| N | Nitrogen |
| Na | Sodium |
| NA | Numerical Aperture |
| NAA | Neutron Activation Analysis |
| Nb | Niobium |
| NBE | Neutral Beam Etching |
| NBTI | Negative Temperature Bias Instability |
| NCMS | National Center For Manufacturing And Science |
| NCS | Network Communication Standard |
| Nd | Neodymium |
| NDA | Nondisclosure Agreement |
| NDC | Nitrogen-doped Carbide |
| NDE | Nondestructive Evaluation |
| NDIR | Nondispersive Infrared Spectroscopy |
| NDP | Neutron Depth Profiling |
| NDT | Nondestructive Testing |
| NDUV | Nondispersive Ultraviolet Spectroscopy |
| Ne | Neon |
| NEA | Noise Equivalent Absorbance |
| NEA | Negative Electron Affinity |
| NEC | National Electric Code |
| NESHAP | National Emissions Standards For Hazardous Air Pollutants |
| NFOM | Near Field Optical Microscopy |
| NFPA | National Fire Protection Association |
| NGL | Next Generation Lithography |
| NGL-MCOC | Next Generation Lithography - Mask Center Of Competence |
| Ni | Nickel |
| NILS | Normalized Image Log Shape |
| NIOSH | National Institute For Occupational Safety And Health |
| NIRA | Near Infrared Reflection Analysis |
| NIST | National Institute Of Standards And Technology |
| Nit | Interface Trap Density |
| NLLD | N-type Lightly Doped Drain |
| nm | Nanometer |
| NMOS | Negative Channel Metal-oxide Semiconductor |
| NMR | Nuclear Magnetic Resonance |
| NN | Neural Network |
| No | Nobelium |
| Np | Neptunium |
| NP | Nutrification Potential |
| NPN | Negative-positive-negative |
| NPV | Net Present Value |
| NPW | Nonproduct Wafer |
| NRA | Nuclear Reaction Analysis |
| NRDD | Non-referential Defect Detection |
| NRE | Nonrecurring Engineering |
| NRZ | Non-return To Zero |
| NSE | Neutral Stream Etch |
| Nsurf | Silicon Surface Doping Density |
| NTP | Normal Temperature And Pressure |
| NTRS | National Technology Roadmap For Semiconductors |
| NTU | Nephelometric Turbidity Units |
| NVD | Non-visual Defect |
| NVR | Nonvolatile Residue |
| NWL | Next Wavelength |