| D | Digital To Analog |
| D/B | Die Bonding |
| D/I | Develop Inspect |
| D/I | Dense Vs. Isolated |
| DAC | Digital-to-analog Converter |
| DAC | Dielectric Aging Chamber |
| DARPA | Defense Advanced Research Projects Agency (see ARPA) |
| DAS | Direct Absorption Spectroscopy |
| DASSL | Differential Algebraic System Solver |
| dBa | Adjusted Decibel |
| DBMS | Database Management System |
| DBP | Data Processing Board |
| DC | Direct Current |
| DCA | Direct Chip Attachment |
| DCATS | Double-contained Acid Transfer System |
| DCCF | Discounted Cumulative Cash Flow |
| DCE | Distributed Computer Environment |
| DCG | Distortion Calibration Grid |
| DCG | Domain Coordination Group |
| DCIV | D Irect-current Current-voltage |
| DCL | Digital Command Language |
| DCL | Display Communication Log |
| DCP | Dry Chemical Planarization |
| DCS | Dichlorosilane |
| DCT | Defect Control Tool |
| DCVD | Dieletric Chemical Vapor Deposition |
| DD | Defect Density |
| DDH | Direct-to-digital Holography |
| DDL | Device Description Language |
| DDMS | Defect Data Management System |
| DEDS | Discrete-event Dynamic Simulation |
| DEE | Detailed Equipment Events |
| DES | Data Encryption Standard |
| DES | Display Equipment Status |
| DF | Darkfield |
| DFC | Densified Fluid Clean |
| DFE | Dual Frequency Etch |
| DfESH | Design For Environment, Safety, And Health |
| DFLP | Design For Low Power |
| DFM | Design For Manufacturability |
| DFR | Design For Reliability |
| DFT | Design For Testability |
| DFT | Design For Test |
| DGM | Dynamic Grid Matching |
| DGOX | Dual Gate Oxide |
| DHF | Dilute Hydrofluoric Acid |
| DI | Deionized |
| DI | Dielectric Isolation |
| DI | Dissolution Inhibitor |
| DIBL | Drain-induced Barrier Leakage |
| DIC | Differential Interference Contrast |
| DICE | DARPA Initiative In Concurrent Engineering |
| DIL | Dual Inline |
| DIP | Dual Inline Package |
| DIPPR | Design Institute For Physical Properties |
| Dit | Interface Trap Density |
| DLB | Dielectric Low Temperature Bake |
| DLBI | Device Level Burn-in |
| DLM | Dual-level Metal |
| DLOC | Developed Source Lines Of Code |
| DLS | Display Lot Status |
| DLT | Device Level Test |
| DLTS | Deep Level Transient Spectroscopy |
| DM | Defect Management |
| DMA | Direct Memory Access |
| DMA | Dynamic Mechanical Analysis |
| DMH | Display Message Helps |
| DML | Data Manipulation Language |
| DML | Display Message Log |
| DMM | Digital Multimeter |
| DMOS | Diffused Metal-oxide Semiconductor |
| DMR | Display Move Requests |
| DMS | Data Management Standard |
| DMS | Data Management System |
| DNN | Dark Narrow Normal |
| DNO | Dark Narrow Oblique |
| DO | Dynamic Optimization |
| DOA | Dead-on Alignment |
| DOAS | Differential Optical Absorption Spectroscopy |
| DOE | Design Of Experiments |
| DOF | Depth Of Field |
| DOF | Depth Of Focus |
| DOP | Dioctylphthalate |
| DOS | Disk Operating System |
| DOTS | Digital-optical Technology System |
| DPA | Destructive Physical Analysis |
| DPB | Data Processing Board |
| DPF | Dense Plasma Focus |
| DPI | Dots Per Inch |
| DPM | Digital Panel Meter |
| DPP | Discharge-produced Plasma |
| DPS | Display Process Status |
| DPS | Decoupled Plasma Source |
| DPSRAM | Dual-port Static Random Access Memory |
| DQE | Detective Quantum Efficiency |
| DRAM | Dynamic Random Access Memory |
| DRAPAC | Design Rule And Process Architecture Council |
| DRC | Design Rule Check |
| DRE | Destruction Removal Efficiency |
| DRIFTS | Diffuse Reflectance Infrared Fourier Transform Spectroscopy |
| DRT | Defect Review Tool |
| DSA | Display System Activity |
| DSA | Dimensionally Stable Anode |
| DSC | Differential Scanning Calorimetry |
| DSE | Droplet Surface Etching |
| DSF | Dead Space Free |
| DSIMS | Dynamic Secondary Mass Spectroscopy |
| DSMC | Direct Simulation Monte Carlo |
| DSP | Differential Signal Processing |
| DSP | Digital Signal Processing |
| DSQ | Downstream Quartz |
| DSQ | Decoupled Source Quartz |
| DSS | Display Stocker Status |
| DSW | Direct Step-on-wafer |
| DT | Dynamic Test |
| DTA | Differential Thermal Analysis |
| DTC | Direct Thermocouple Control |
| DTHM | Dual Top Hardmask |
| DTL | Diode Transistor Logic |
| DTM | Defect Test Monitor |
| DTM | Delay Time Multiplier |
| DTM | Device Test Module |
| DTM | Digital Terrain Map |
| DTM | Demonstration Test Method |
| DTMPN | Defect Test Monitor Phase Number |
| DUF | Diffusion Under Epitaxial Film |
| DUI | Detached User Interface |
| DUT | Device Under Test |
| DUV | Deep Ultraviolet |
| DUVSE | Deep Ultraviolet Spectroscopic Ellipsometry |
| DV | Design Verification |
| DVER | Design Rule Verification |
| DVI | Digital Video Interactive |
| DVM | Digital Voltmeter |
| DVS | Display Vehicle Status |
| DVS | Dynamic Voltage Stress |
| DVS | Dynamic Voltage Screen |
| DWG | Domain Work Group |
| DWN | Dark Wide Normal |
| DWO | Dark Wide Oblique |
| Dy | Dysprosium |