| La | Lanthanum |
| LAMMA | Laser Micro-mass Analysis |
| LAMMS | Laser Micro-mass Spectroscopy |
| LAN | Local Area Network |
| LANL | Los Alamos National Laboratory |
| LAR | Lot Age Report |
| LBNL | Lawrence Berkeley National Laboratory |
| LC | Liquid Chromatography |
| LC | Lens Control |
| LCA | Lifecycle Analysis |
| LCA | Lifecycle Assessment |
| LCC | Leaded Chip Carrier |
| LCC | Lifecycle Costing |
| LCD | Liquid Crystal Display |
| LCI | Lifecycle Inventory |
| LCL | Lower Confidence Limit |
| LCR | Inductance, Capacitance, Resistance |
| LDA | Linear Discriminant Analysis |
| LDD | Lightly Doped Drain |
| LDL | Lower Detection Limit |
| LDOS | Low Local Densities Of States |
| LDP | Low Density Plasma |
| LDPE | Low Density Polyethylene |
| LDS | Liquid Delivery System |
| LEC | Liquid Encapsulated Czochralski Crystal |
| LED | Light-emitting Diode |
| LEIS | Low Energy Ion Scattering |
| LEL | Lower Explosive Limit |
| LER | Line Edge Roughness |
| LF | Laminar Flow |
| LF | Low Frequency |
| LFL | Lower Flammable Limit |
| LGA | Land Grid Array |
| LGQ | Linear Gaussian Quadratic |
| Li | Lithium |
| LI | Laser Interferometry |
| LIC | Linear Integrated Circuit |
| LID | Leadless Inverted Device |
| LIDAR | Light Detection And Ranging Technology |
| LIFO | Last In, First Out |
| LIMA | Laser-induced Mass Analysis |
| LIMS | Laser-induced Mass Spectrometry |
| LIR | Location Inventory Report |
| LKDM | Low-k Dielectric Material |
| LLCC | Leadless Chip Carrier |
| LLD | Lower Limit Of Detection |
| LLM | Local Linear Models |
| LLNL | Lawrence Livermore National Laboratory |
| LLNQ | Least Lots Next Queue |
| LLS | Localized Light Scatterer |
| LM | Light Microscope |
| LMIS | Liquid Metal Ion Source |
| LMMA | Laser Microprobe Mass Analysis |
| LOC | Level Of Concern |
| LOCOS | Local Oxidation Of Silicon |
| LOD | Limit Of Detection |
| LOS | Loss Of Selectivity |
| LOS | Line Of Sight |
| LOTO | Lockout/tagout |
| LPC | Linear Predictive Coding |
| LPC | Laser Particle Counter |
| LPC | Low Particle Concentration |
| LPC | Liquid Particle Counter |
| LPC | Liquid-borne Particle Counter |
| LPCVD | Low Pressure Chemical Vapor Deposition |
| LPD | Light Point Defect |
| LPD | Low Pressure Dryer |
| LPE | Liquid Phase Epitaxy |
| LPI | Liquid Photo Image |
| LPI | Low Pressure Isolation |
| Lpoly | Gate Length |
| LPP | Laser-produced Plasma |
| LPR | Laser Plasma Reflectometer |
| LPSM | Levenson Phase Shift Mask |
| LPT | Linear Polishing Technology |
| LPV | Low Pressure Vent |
| Lr | Lawrencium |
| LRP | Long-range Plan |
| LRS | Laser Raman Spectroscopy |
| LSB | Least Significant Bit |
| LSCVD | Liquid Source Misted Chemical Vapor Deposition |
| LSE | Latex Sphere Equivalent |
| LSHI | Large-scale Hybrid Integration |
| LSI | Large-scale Integration |
| LSM | Laser Scanning Microscope |
| LTA | Laser Thermal Anneal |
| LTC | Lithographic Test Chip |
| LTCVD | Low Temperature Chemical Vapor Deposition |
| LTDR | Low Temperature Data Retention |
| LTE | Local Thermal Equilibrium |
| LTE | Local Thermodynamic Equilibrium |
| LTEM | Low Thermal Expansion Material |
| LTL | Lot-to-lot |
| LTO | Low Temperature Oxide |
| LTPD | Lot Tolerance Percent Defective |
| LTV | Local Thickness Variation |
| Lu | Lutetium |
| LUW | Logical Unit Of Work |
| LV | Latent Variable |
| LVDT | Linear Voltage Differential Transducer |
| LVDT | Linear Variable Displacement Transducer |
| LVDT | Linear Variable Differential Transformer |
| LVI | Low Voltage Inverter |
| LVS | Layout Verification Of Schematic |
| LWB | Lithography Workbench |
| LWR | Linewidth Reduction |
| LWS | Large Wafer Study |