| B | Billion |
| B | Boron |
| Ba | Barium |
| BACT | Best Available Control Technology |
| BARC | Backside Antireflective Coating |
| BASE | Boston Area Semiconductor Education (Council) |
| BAW | Bulk Acoustic Wave |
| BC | Bias Contrast |
| BCAD | Business Computer-aided Manufacturing |
| BCB | Benzocyclobutene |
| BCD | Binary Coded Decimal |
| BCD | Bulk Chemical Distribution |
| BDEV | Behavior-level Deviation |
| BDP | Bilateral Datum Plane |
| BDS | Brownian Dynamics Simulation |
| BDS | Beam Delivery System |
| Be | Beryllium |
| BENU | Bull's Eye Nonuniformity |
| BEOL | Back End-of-line |
| BES | Backscatter Electron Signal |
| BESOI | Bonded And Etchedback SOI |
| BF | Brightfield I |
| BFGS | Broyden-Fletcher-Goldfarb-Shanno Optimization Algorithm |
| BFL | Buffered Field-effect-transistor Logic |
| BGA | Ball Grid Array |
| BGS | Bulk Gas System |
| BHT | Brinell Hardness Test |
| BI | Burn In |
| Bi | Bismuth |
| BiCMOS | Bipolar Complementary Metal-oxide Semiconductor |
| BIFET | Bipolar Field-effect Transistor |
| BIM | Binary Intensity Mask |
| BiMOS | Bipolar Metal-oxide Semiconductor |
| BIST | Built-in Self Test |
| BIT | Bulk Ion Temperature |
| BITE | Built-in Test Equipment |
| Bk | Berkelium |
| BKM | Best Known Methods |
| BLD | Beam Lead Device |
| BLEVE | Boiling Liquid Expanding Vapor Explosion |
| BLOK | Barrier Low-k |
| BMC | Bubble Memory Controller |
| BMD | Bulk Micro Defect |
| BOE | Buffered Oxide Etchant |
| BOR | Bottom Of Range |
| BOSS | Book Of SEMI Standards |
| BOSS | Binary Object Storage System |
| BOSS | Burn-out Of Sacrificial Substances |
| BOX | Buried Oxide |
| BPE | Beam Profile Ellipsometry |
| BPR | Beam Profile Reflectometry |
| BPR | Business Process Re-engineering |
| BPSG | Boro Phosphosilicate |
| BPTEOS | Borophosphosilicate Glass From A TEOS Oxysilane Source |
| Br | Bromine |
| BSA | Beta Site Agreement |
| BSED | Backscattered Electron Detection Or Detector |
| BSR | Backside Rinse |
| BT | Bismallimide Triazene |
| BTAB | Bumped Tape Automated Bonding |
| BTI | Bias Temperature Instability |
| BTS | Biased Thermal Stress |
| BV | Breakdown Voltage |
| BVH | Buried Via Hole |
| BW | Bandwidth |