Halbleitertechnologie von A bis Z

Alles über Halbleiter und die Waferfertigung

N Nitrogen
Na Sodium
NA Numerical Aperture
NAA Neutron Activation Analysis
Nb Niobium
NBE Neutral Beam Etching
NBTI Negative Temperature Bias Instability
NCMS National Center For Manufacturing And Science
NCS Network Communication Standard
Nd Neodymium
NDA Nondisclosure Agreement
NDC Nitrogen-doped Carbide
NDE Nondestructive Evaluation
NDIR Nondispersive Infrared Spectroscopy
NDP Neutron Depth Profiling
NDT Nondestructive Testing
NDUV Nondispersive Ultraviolet Spectroscopy
Ne Neon
NEA Noise Equivalent Absorbance
NEA Negative Electron Affinity
NEC National Electric Code
NESHAP National Emissions Standards For Hazardous Air Pollutants
NFOM Near Field Optical Microscopy
NFPA National Fire Protection Association
NGL Next Generation Lithography
NGL-MCOC Next Generation Lithography - Mask Center Of Competence
Ni Nickel
NILS Normalized Image Log Shape
NIOSH National Institute For Occupational Safety And Health
NIRA Near Infrared Reflection Analysis
NIST National Institute Of Standards And Technology
Nit Interface Trap Density
NLLD N-type Lightly Doped Drain
nm Nanometer
NMOS Negative Channel Metal-oxide Semiconductor
NMR Nuclear Magnetic Resonance
NN Neural Network
No Nobelium
Np Neptunium
NP Nutrification Potential
NPN Negative-positive-negative
NPV Net Present Value
NPW Nonproduct Wafer
NRA Nuclear Reaction Analysis
NRDD Non-referential Defect Detection
NRE Nonrecurring Engineering
NRZ Non-return To Zero
NSE Neutral Stream Etch
Nsurf Silicon Surface Doping Density
NTP Normal Temperature And Pressure
NTRS National Technology Roadmap For Semiconductors
NTU Nephelometric Turbidity Units
NVD Non-visual Defect
NVR Nonvolatile Residue
NWL Next Wavelength