La |
Lanthanum |
LAMMA |
Laser Micro-mass Analysis |
LAMMS |
Laser Micro-mass Spectroscopy |
LAN |
Local Area Network |
LANL |
Los Alamos National Laboratory |
LAR |
Lot Age Report |
LBNL |
Lawrence Berkeley National Laboratory |
LC |
Liquid Chromatography |
LC |
Lens Control |
LCA |
Lifecycle Analysis |
LCA |
Lifecycle Assessment |
LCC |
Leaded Chip Carrier |
LCC |
Lifecycle Costing |
LCD |
Liquid Crystal Display |
LCI |
Lifecycle Inventory |
LCL |
Lower Confidence Limit |
LCR |
Inductance, Capacitance, Resistance |
LDA |
Linear Discriminant Analysis |
LDD |
Lightly Doped Drain |
LDL |
Lower Detection Limit |
LDOS |
Low Local Densities Of States |
LDP |
Low Density Plasma |
LDPE |
Low Density Polyethylene |
LDS |
Liquid Delivery System |
LEC |
Liquid Encapsulated Czochralski Crystal |
LED |
Light-emitting Diode |
LEIS |
Low Energy Ion Scattering |
LEL |
Lower Explosive Limit |
LER |
Line Edge Roughness |
LF |
Laminar Flow |
LF |
Low Frequency |
LFL |
Lower Flammable Limit |
LGA |
Land Grid Array |
LGQ |
Linear Gaussian Quadratic |
Li |
Lithium |
LI |
Laser Interferometry |
LIC |
Linear Integrated Circuit |
LID |
Leadless Inverted Device |
LIDAR |
Light Detection And Ranging Technology |
LIFO |
Last In, First Out |
LIMA |
Laser-induced Mass Analysis |
LIMS |
Laser-induced Mass Spectrometry |
LIR |
Location Inventory Report |
LKDM |
Low-k Dielectric Material |
LLCC |
Leadless Chip Carrier |
LLD |
Lower Limit Of Detection |
LLM |
Local Linear Models |
LLNL |
Lawrence Livermore National Laboratory |
LLNQ |
Least Lots Next Queue |
LLS |
Localized Light Scatterer |
LM |
Light Microscope |
LMIS |
Liquid Metal Ion Source |
LMMA |
Laser Microprobe Mass Analysis |
LOC |
Level Of Concern |
LOCOS |
Local Oxidation Of Silicon |
LOD |
Limit Of Detection |
LOS |
Loss Of Selectivity |
LOS |
Line Of Sight |
LOTO |
Lockout/tagout |
LPC |
Linear Predictive Coding |
LPC |
Laser Particle Counter |
LPC |
Low Particle Concentration |
LPC |
Liquid Particle Counter |
LPC |
Liquid-borne Particle Counter |
LPCVD |
Low Pressure Chemical Vapor Deposition |
LPD |
Light Point Defect |
LPD |
Low Pressure Dryer |
LPE |
Liquid Phase Epitaxy |
LPI |
Liquid Photo Image |
LPI |
Low Pressure Isolation |
Lpoly |
Gate Length |
LPP |
Laser-produced Plasma |
LPR |
Laser Plasma Reflectometer |
LPSM |
Levenson Phase Shift Mask |
LPT |
Linear Polishing Technology |
LPV |
Low Pressure Vent |
Lr |
Lawrencium |
LRP |
Long-range Plan |
LRS |
Laser Raman Spectroscopy |
LSB |
Least Significant Bit |
LSCVD |
Liquid Source Misted Chemical Vapor Deposition |
LSE |
Latex Sphere Equivalent |
LSHI |
Large-scale Hybrid Integration |
LSI |
Large-scale Integration |
LSM |
Laser Scanning Microscope |
LTA |
Laser Thermal Anneal |
LTC |
Lithographic Test Chip |
LTCVD |
Low Temperature Chemical Vapor Deposition |
LTDR |
Low Temperature Data Retention |
LTE |
Local Thermal Equilibrium |
LTE |
Local Thermodynamic Equilibrium |
LTEM |
Low Thermal Expansion Material |
LTL |
Lot-to-lot |
LTO |
Low Temperature Oxide |
LTPD |
Lot Tolerance Percent Defective |
LTV |
Local Thickness Variation |
Lu |
Lutetium |
LUW |
Logical Unit Of Work |
LV |
Latent Variable |
LVDT |
Linear Voltage Differential Transducer |
LVDT |
Linear Variable Displacement Transducer |
LVDT |
Linear Variable Differential Transformer |
LVI |
Low Voltage Inverter |
LVS |
Layout Verification Of Schematic |
LWB |
Lithography Workbench |
LWR |
Linewidth Reduction |
LWS |
Large Wafer Study |