| T-M | Time-to-market |
| T/C | Thermocompression |
| T/S | Thermosonic |
| Ta | Tantalum |
| TAB | Technical Advisory Board |
| TAB | Tape Automated Bonding |
| TAP | Tool Application Program |
| TAP | Terminal Access Point |
| TAS | Trace Analysis System |
| TASC | Technical Analysis Services For COO |
| TAT | Turnaround Time |
| Tb | Terbium |
| TB | Tied Body |
| TBAH | Tetrabutylammonium Hydroxide |
| TBC | Time-based Competitiveness |
| TBD | Time To Breakdown |
| Tc | Technetium |
| TC | Time Constant |
| TC | Temperature Coefficient |
| TC | Thermocouple |
| TC | Transverse Electric |
| TCA | Test Calibration Assembly |
| TCA | 1,1,1-trichloroethane |
| TCA | Trichloroethate |
| TCAD | Technology Computer-aided Design |
| TCC | Tactical Cell Controller |
| TCDM | Tool Development Cost Model |
| TCE | Temperature Coefficient Of Expansion |
| TCM | Tunneling Current Microscopy |
| TCP | Transformer-coupled Plasma |
| TCP | Tape Carrier Package |
| TCP | Transport Control Protocol |
| TCP/IP | Transmission Control Protocol/internet Protocol |
| TCR | Temperature Coefficient Of Resistance |
| TCU | Temperature Control Unit |
| TD | Thermal Desorption |
| TDDB | Time-dependent Dielectric Breakdown |
| TDEAT | Tetrakis (diethylamino) Titanium |
| TDEV | Transport-level Deviation |
| TDI | Time Delay Integration |
| TDLAS | Tunable Diode Laser Absorption Spectroscopy |
| TDMAT | Tetrakis (dimethylamido) Titanium |
| TDMS | Thermal Desorption Mass Spectrometry |
| TDR | Time Domain Reflectometry |
| TDS | Thermal Desorption Spectroscopy |
| TDT | Thermal Desorption Tube |
| Te | Tellurium |
| TE | Transverse Electric |
| TE | Transmitted Electron |
| TEA | Transverse Excited Atmosphere |
| TEC | Thermal Expansion Coefficient |
| TEC | Test And Electrical Characterization |
| TECAP | Transistor Electrical Characterization And Analysis Program |
| TED | Transient Enhanced Diffusion |
| TED | Transmitted Electron Detection |
| TEG | Technical Exchange Group |
| TEM | Transmission Electron Microscopy |
| TEM | Transverse Electromagnetic |
| TEOS | Tetraethoxysilane |
| TEOS | Tetraethylorthosilicate |
| TEOS | Tetraethelorthosilicate |
| TEOS | Tetrethoxysilicide |
| TEPO | Triethylphosphate |
| TES | Trench Etch Stop |
| TFC | Total Fault Coverage |
| TFD | Total Focal Deviation |
| TFE | Tetrafluorethylene |
| TFT | Thin Film Transistors |
| TFX | Toxic Effects |
| Tg | Glass Transition Temperature |
| TG | Thermogravimetry |
| TGA | Thermal Gas Analysis |
| TGA | Thermal Gravimetric Analysis |
| TGM | Toxic Gas Monitoring |
| Th | Thorium |
| THB | Biased Temperature And Humidity |
| THC | Total Hydrocarbons |
| Ti | Titanium |
| TIBA | Triisobutlaluminum |
| TIC | Total Ion Count |
| TIR | Total Indicator Runout |
| TIR | Total Internal Reflection |
| TIS | Tool Induced Shift |
| TIS | Total Integrated Signal |
| Tl | Thallium |
| TLC | Thin Layer Chromatography |
| TLE | Tool Loading Elevator |
| TLI | Thin Layer Imaging |
| TLM | Tape-laying Machine |
| TLM | Telemeter |
| TLM | Transition Line Model |
| TLP | Transmission Line Pulse |
| TLV | Threshold Limit Value |
| TLV/TWA | Threshold Limit Value/time-weighted Average |
| Tm | Thulium |
| TM | Transport Module |
| TM | Transfer Module |
| TM | Transverse Magnetic |
| TMA | Thermal Mechanical Analyzer |
| TMB | Trimethylborate |
| TMC | Transport Module Controller |
| TMC | Transfer Module Controller |
| TML | Total Mass Loss |
| TMP | Trimethylphosphate |
| TMP | Turbomolecular Pump |
| TMU | Total Measurement Uncertainty |
| TO | Transistor Outline Package |
| TOA | Take-off Angle |
| TOC | Total Organic Carbon |
| TOC | Total Oxidizable Carbon |
| TOF | Time-of-flight |
| TOR | Top Of Range |
| TP | Teach Pendant |
| TP2 | Tool Performance Tracking Platform |
| TPD | Temperature Program Desorption |
| TPG | Test Pattern Generation |
| TPM | Total Productive Maintenance |
| TPM | Total Productive Manufacturing |
| TPRS | Temperature Programmed Reaction Spectroscopy |
| TPU | Thermal Processing Unit |
| TQ | Total Quality |
| TQM | Total Quality Management |
| TSCA | Toxic Substances Control Act |
| TSI | Top Surface Imaging |
| TSOP | Thin Small Outline Package |
| TSP | Temperature-sensitive Parameter |
| TSV | Through Silicon Via |
| TTL | Transistor-transistor Logic |
| TTL | Through The Lens |
| TTV | Total Thickness Variation |
| TVS | Triangular Voltage Sweep |
| TWA | Time-weighted Average |
| TWG | Technical Working Group |
| TXRF | Total X-ray Fluorescence |