01 ESD Protection Structures ESD Models and Damage Mechanisms Protection Diodes and Snapback Behavior Grounded-Gate NMOS and Power Clamps Open chapter →
02 Electromigration, TDDB and NBTI/PBTI Electromigration Time-Dependent Dielectric Breakdown (TDDB) Bias Temperature Instability (NBTI/PBTI) Open chapter →
03 Burn-in and HTOL Testing From Burn-in to HTOL Qualification Testing HTOL Test Conditions The Arrhenius Model for Lifetime Prediction Open chapter →
04 Automotive, Military, and Space Qualification Why consumer-grade isn't enough Temperature requirements compared Radiation effects in space Radiation Hardening by Design (RHBD) Qualification and screening processes Reliability metrics Open chapter →
