Selected letter
S
Filter the list directly by acronym.
S
Sulfur
S/A
Sensor/actuator
S/D
Source/drain
s/n
Serial Number
S/N
Signal-to-noise
SA
Surface Area
SA
Subresolution Assist
SA
Structured Analysis
SA
Sensitivity Analysis
SA-BPR
Self-aligned Buried Power Rail
SA-CFET
Self-aligned Complementary Field-effect Transistor
SA-CT
Self-aligned Contacts
SA-TSV
Self-aligned Through-silicon Via
SAA
Static Automated Analysis
SAB
Sensor/actuator Bus
SACVD
Sub-atmospheric Chemical Vapor Deposition
SAD
Selected Area Diffraction
SAE
Society Of Automotive Engineers
SAF
Stuck-at Fault
SAM
Scanning Auger Microscopy
SAM
Scanning Acoustical Microscopy
SAM
Self-assembled Monolayer
SANS
Small Angle Neutron Scattering
SAT
Spray Acid Tool
SAW
Surface Acoustic Wave
SAXS
X-ray Scattering
Sb
Antimony
SB
Strong Base Ion Exchange
SBC
Standard Buried Collector
SBl
Safety Bulletin
Sc
Scandium
SC1
Standard Clean 1
SC2
Standard Clean 2
SCA
Surface Charge Analysis
SCALE
SEMATECH Cell Application Learning Environment
SCALPEL
Scattering With Aperture Limited Projection Lithography
SCBA
Self-contained Breathing Apparatus
SCC
Strategic Cell Controller
SCCDRM
Single Crystal Critical Dimension Reference Material
SCCS
Source Code Control System
SCDS
Super Catalytic Decomposition System
SCE
Saturated Calomel Electrode
SCE
Short Channel Effects
SCE
Short Channel Effects
SCF
Supercritical Fluid
SCFH
Standard Cubic Feet Per Hour
SCI
Surface Charge Imaging
SCIC
Semiconductor Integrated Circuit
SCM
Scanning Capacitance Microscopy
SCOE
SEMATECH Center Of Excellence
SCP
Single Chip Package
SCR
Silicon Controlled Rectifier
SD
Small Dual In-line Package
SD
Structured Design
SDFL
Schottky-diode FET Logic
SDK
Software Development Kit
SDLC
Synchronous Data Link Control
SDM
Specific Device Model
SDS
Smart Distributed System
SDS
Safe Delivery System
SDSI
Synchronous Data-link Control
Se
Selenium
SE
Spectroscopic Ellipsometry
SE
Secondary Electron
SE
Scattered Electron
SEAJ
Semiconductor Equipment Association Of Japan
SEC
Size Exclusion Chromatography
SECS
Semiconductor Equipment Communications Standard
SEG
Selective Epitaxial Growth
SEIM
Software Engineering Improvement Method
SEM
Scanning Electron Microscopy
SEM
Specific Equipment Model
SEM
Scanning Electron Microscope
SEMI
Semiconductor Equipment And Materials International
SEMICON
Semiconductor Convention
SemiSPIN
Semiconductor Software Process Improvement Network
SEP
Software Engineering Process
SEP
Spin Etch Planarization
SEPG
Software Engineering Process Group
SEQDB
Semiconductor Equipment Database
SER
Soft Error Rate
SerDes
Serializer/Deserializer
SerDes
Serializer-Deserializer
SETEC
Semiconductor Equipment Technology Center
SEVD
Sphere Equivalent Volume Diameter
SFC
Supercritical Fluid Chromatography
SFCS
Shop Floor Control System
SFCS I/F
Shop Floor Control System Interface
SFP
Stress-free Polishing
SGML
Standard Generalized Markup Language
SGMM
Semiconductor Generic Manufacturing Model
SGMRS
Semiconductor Generic Manufacturing Requirements Specification
SHI
Spatial Heterodyned Interferometry
SHMOO
Shmoo Plot
Si
Silicon
SIA
Semiconductor Industry Association
SiC
Silicon Carbide
SIDP
Sputter Ion Depth Profiling
SIG
Special Interest Group
SIL
Systems Integration Lab (was ATF)
SILC
Stress-induced Leakage Current
SiLK
Silicon Low-k
SIM
Selective Ion Marketing
SIM
Selective Ion Monitoring
SIM
Subscriber Identity Module
SIMO
Single Input, Multi Output
SIMOX
Separation By Implantation Of Oxygen
SIMS
Secondary Ion Mass Spectroscopy
SiO2
Silicon Dioxide
SIP
SEMATECH Internal Program
SIP
Self-ionizing Plasma
SIRIJ
Semiconductor Industry Research Institute Of Japan
SIS
Self-ionized Sputter
SISO
Single Input, Single Output
SIV
Sensors In Vacuum
SL
Specification Limit
SLAM
Scanning Laser Acoustic Microscopy
SLAM
Single Layer Alumina Metallization
SLC
Surface Laminar Circuit
SLDY
Systematic Limited Yield
SLM
Single-level Metal
SLOC
Source Lines Of Code
SLSI
Super Large Scale Integration
SLT
System Level Test
Sm
Samarium
SM
Stress Migration
SMB
Single-mask Bumping
SMC
Surface-mounted Components
SMD
Surface-mounted Device
SME
Subject Matter Expert
SME
Software Maintenance Engineer
SME
Semiconductor Manufacturing Equipment
SMG
Screen Management Guide
SMIF
Standard Mechanical Interface
SMLY
Systematic Mechanisms Limited Yield
SMPM
SECS Message Protocol Machine
SMR
Semiconductor Mask Representation
SMS
SECS Message Service
SMT
Surface Mount Technology
SMTS
Strategic Material Transport System
Sn
Tin
SNL
Sandia National Laboratory
SNMS
Sputtered Neutral Mass Spectroscopy
SNOM
Scanning Nearfield Optical Microscopy
SNR
Signal-to-noise Ratio
SO
Small Outline (package)
SOC
System On Chip
SOD
Spin-on Dielectric
SODAS
SEMATECH Organized Damage Analysis Software
SOG
Spin-on Glass
SOI
Silicon On Insulator
SOI
Silicon-On-Insulator
SOIC
Small Outline Integrated Circuit
SOM
Scanning Optical Microscopy
SOM
Sulfuric Acid-ozone Mixture
SON
Small Outline Nonleaded Package
SONOS
Silicon/oxide/nitride/oxide/silicon
SOP
Standard Operating Procedure
SOS
Silicon On Sapphire
SOW
Statement Of Work
SPC
Statistical Process Control
SPF
Spectral Purity Filter
SPI
Software Process Improvement
SPICE
Simulation Program With Integrated Circuit Emphasis
SPIDER
SEMATECH Process Induced Damage Effect Revealer
SPIDER-MEM
SPIDER-Manufacturing Equipment Monitor
SPIE
Society Of Photo-Optical Instrumentation Engineers
SPIN
Software Process Improvement Network
SPL
Surface Protection Layer
SPM
Scanning Probe Microscopy
SPM
Sulfuric Acid/hydrogen Peroxide Mixture
SPP
Single-phase Printing
SPR
Semiconductor Process Representation
SPS
Surface Preparation System
SPT
Shortest Processing Time
SPV
Surface Photovoltage
SQC
Statistical Quality Control
SQL
Structured Query Language
SQPMM
Software Quality And Process Maturity Model
Sr
Strontium
SRAC
Supplier Relations Action Council
SRAM
Static Random Access Memory
SRAM
Static Random-access Memory
SRC
Semiconductor Research Corporation
SRM
Standard Reference Material
SRP
Spreading Resistance Probe
SRPT
Shortest Remaining Processing Time
SRS
Software Requirements Specification
SSA
Semiconductor Safety Association
SSA
Spatial Signature Analysis
SSC
Subsystem Controller
SSD
Solid State Drive
SSD
Solid-State Drive
SSE
Sum Squared Error
SSEM
Stepper Specific Equipment Model
SSI
Small Scale Integration
SSM
Strategic Sourcing Methodology
SSQA
Standardized Supplier Quality Assessment
SSRL
SEMATECH Software Reuse Library
SSRP
SEMATECH Software Reuse Program
SST
Solid-State Transformer
STA
Static Timing Analysis
STAC
Sense, Think, Act, Communicate
STAR
Simultaneous Transmitted And Reflected
STEL
Short-term Exposure Limit
STEM
Scanning Transmission Electron Microscope/microscopy
STI
Shallow Trench Isolation
STIFI
Shallow Trench Isolation Final Inspection
STM
Scanning Tunneling Microscopy
STP
Standard Temperature And Pressure
STP
System Test Plan
SU
Subresolution Attenuated
SUT
System Under Test
SVD
Singular Value Decomposition
SVID
System Variable Identifier
SWAT
Software Action Team
SWC
Solvent Waste Collection
SWEAT
Standard Wafer-level Electromigration Accelerated Test
SWI
Static Walkthrough/inspection
SWIM
Semiconductor Workbench For Integrated Modeling
SWP
Single Wafer Processing
SWR
Semiconductor Wafer Representation
SWV
Square Wave Voltammetry
SXR
Specular X-ray Reflectance Or Reflectometry
SystemC
SystemC